CoolLED Heads to SEMICON Europa 2026 with Advanced LED Technology for Semiconductor Inspection
From wafer defect detection to advanced optical metrology, CoolLED is taking its semiconductor illumination expertise to Munich this November, following the team's recent visit to SEMICON West.
CoolLED will be exhibiting at SEMICON Europa 2026, taking place from 10–13 November at Messe München. The team will be welcoming visitors to Stand C2157 to discuss the latest developments in LED illumination for semiconductor inspection, optical metrology and industrial imaging.
The European exhibition follows Duncan Stacey's recent visit to SEMICON West in San Francisco, where semiconductor equipment manufacturers and technology suppliers gathered to discuss developments across the industry.
For CoolLED, the focus is clear: helping manufacturers take advantage of increasingly capable LED illumination technology in their inspection and measurement equipment.
A Changing Approach to Semiconductor Illumination
Semiconductor inspection places demanding requirements on illumination. As device architectures become more complex, equipment manufacturers need consistent imaging conditions, accurate defect detection and sufficient throughput to support modern manufacturing processes.
Traditional lamp technologies, including halogen, metal halide and pulsed xenon, have supported semiconductor inspection for many years. Pulsed xenon continues to have an important role in applications requiring exceptional peak intensity and very short flashes.
However, developments in high-power LED technology are providing manufacturers with new options, particularly for systems requiring selected wavelengths, precise timing and repeatable illumination.
LEDs can be electronically triggered, independently controlled and configured to emit within specific spectral bands. This makes them well suited to automated inspection systems that require reliable synchronisation with cameras and repeatable optical measurements.
Why consider LED illumination? Wavelength-specific imaging, fast electronic switching, stable output and reduced maintenance requirements can all contribute to more consistent and efficient inspection processes.
Our recent article on pulsed xenon and its role in semiconductor inspection takes a closer look at the characteristics of traditional flash illumination and where LEDs offer an alternative.
How Different LED Wavelengths Support Semiconductor Inspection
Light interacts differently with materials depending on its wavelength. In semiconductor inspection, selecting the right spectral region can help improve image contrast, distinguish surface features and reveal structures that are difficult to examine using conventional visible illumination.
CoolLED's OEM illumination technology supports wavelengths across the UV, visible, near-infrared (NIR) and short-wave infrared (SWIR) regions. Each offers different possibilities depending on the inspection application.
Wafer Surface Inspection
UV and visible wavelengths can support high-contrast imaging of selected surface features, defects and contamination.
Optical Metrology
Stable, repeatable illumination can support accurate optical measurements, alignment and dimensional inspection.
Advanced Packaging
Configurable illumination can help inspect packaging structures, bond pads and complex interconnects.
NIR and SWIR Imaging
Selected longer wavelengths can support silicon transmission imaging, backside inspection and analysis of subsurface structures.
By combining different LED wavelengths within a single illumination platform, instrument manufacturers can design inspection sequences around the specific materials and features being examined. Performance will depend on the optical configuration, camera sensitivity and inspection target.
The Amora Series: Built for OEM Integration
At SEMICON Europa, CoolLED will be discussing the capabilities of its Amora Series, a configurable OEM LED illumination platform developed for scientific and industrial equipment manufacturers.
Offering wavelength options from approximately 250 to 2000 nm, Amora spans UV, visible, NIR and SWIR illumination. Manufacturers can select wavelength combinations and delivery configurations suited to their specific instrument design.
Optical delivery options include fibre-coupled illumination, liquid light guides and collimated output, with electronic control options including TTL, USB, RS-232 and Ethernet, depending on the configuration.
This flexibility allows CoolLED's engineering team to work directly with OEM customers on illumination solutions developed around their optical, mechanical and electronic requirements.
From Development to Semiconductor Production
CoolLED's work in the semiconductor sector already includes a collaboration with Camtek, a specialist in semiconductor inspection and metrology equipment.
The companies worked together to develop multi-wavelength LED illumination for advanced wafer inspection, progressing from initial development to in-fab qualification in just nine months. The technology has subsequently been deployed in production across multiple customer sites.
The project illustrates the importance of close cooperation between illumination specialists and equipment manufacturers, particularly where optical performance, system integration and repeatability are critical.
Find out more about the CoolLED and Camtek collaboration and how LED illumination has been integrated into semiconductor inspection technology.
SEMICON Europa 2026: Frequently Asked Questions
Find out more about CoolLED's attendance and the illumination technologies being discussed at the exhibition.
Where can I find CoolLED at SEMICON Europa 2026?
CoolLED will be exhibiting at Stand C2157 at Messe München, Germany, from 10–13 November 2026. Visitors can meet the team to discuss OEM LED illumination for semiconductor inspection and optical metrology.
What semiconductor applications can CoolLED's technology support?
CoolLED develops configurable LED illumination for applications including wafer defect inspection, automated optical inspection, optical metrology, advanced packaging and selected NIR/SWIR imaging techniques.
What advantages do LEDs offer for automated inspection?
High-power LEDs offer electronic triggering, precise intensity adjustment, selectable wavelengths and repeatable optical output. These features can support synchronisation with imaging systems and consistent inspection conditions.
Can CoolLED develop illumination for a specific OEM instrument?
Yes. CoolLED works directly with equipment manufacturers to develop illumination configurations based on their wavelength, optical delivery, control and mechanical requirements. Its Amora Series offers configurable UV, visible, NIR and SWIR technology.
Meet the CoolLED Team in Munich
Whether you're developing a new inspection system, considering alternative illumination technologies or looking for a specialist OEM supplier, we'd be pleased to discuss your requirements.
Visit CoolLED at SEMICON Europa 2026, Stand C2157, from 10–13 November.
You can also find detailed information about our semiconductor illumination capabilities on our dedicated OEM Illumination website.
Discover Our Semiconductor Illumination Technology →
